Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 167
Peter W. Hawkesen Limba Engleză Hardback – 25 aug 2011
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians
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Specificații
ISBN-13: 9780123859853
ISBN-10: 0123859859
Pagini: 360
Dimensiuni: 152 x 229 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0123859859
Pagini: 360
Dimensiuni: 152 x 229 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
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Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in generalCuprins
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Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE