Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 139
Editat de Peter W. Hawkesen Limba Engleză Hardback – 30 iun 2006
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Specificații
ISBN-13: 9780120147816
ISBN-10: 0120147815
Pagini: 328
Ilustrații: Approx. 150 illustrations
Dimensiuni: 152 x 229 x 19 mm
Greutate: 0.64 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0120147815
Pagini: 328
Ilustrații: Approx. 150 illustrations
Dimensiuni: 152 x 229 x 19 mm
Greutate: 0.64 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.Cuprins
Retrieval of Shape from Silhouette (A. Bottino, A. Laurentini).Projective Transforms on Periodic Discrete Image Arrays (A. Kingston, I. Svalbe).Ray Tracing in Spherical Interfaces Using Geometric Algebra (Q.M. Sugon, Jr., D.J. McNamara).Prolate Spheroidal Wave Functions and Wavelets (G.G. Walter).
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE