Advances in Imaging and Electron Physics
Peter W. Hawkesen Limba Engleză Hardback – 22 sep 2017
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
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Specificații
ISBN-13: 9780128120873
ISBN-10: 0128120878
Pagini: 212
Dimensiuni: 152 x 229 x 16 mm
Editura: ELSEVIER SCIENCE
ISBN-10: 0128120878
Pagini: 212
Dimensiuni: 152 x 229 x 16 mm
Editura: ELSEVIER SCIENCE
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.Cuprins
1. Convolution in (max; min)-Algebra and Its Role in Mathematical Morphology
Jesús Angulo
2. Critical Magnetic Field and Its Slope, Specific Heat, and Gap for Superconductivity as Modified by Nanoscopic Disorder
Clifford M. Krowne
3. Mirror Electron Microscopy
A. B. Bok, J. B. le Poole, J. Roos and H. de Lang
Jesús Angulo
2. Critical Magnetic Field and Its Slope, Specific Heat, and Gap for Superconductivity as Modified by Nanoscopic Disorder
Clifford M. Krowne
3. Mirror Electron Microscopy
A. B. Bok, J. B. le Poole, J. Roos and H. de Lang
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE