Cantitate/Preț
Produs
Total produse
Vezi coșul
Advances in Imaging and Electron Physics de Peter W. Hawkes

Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 203

Peter W. Hawkes
en Limba Engleză Hardback – 22 sep 2017
Advances in Imaging and Electron Physics, Volume 203, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.


  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Citește tot Restrânge

Din seria Advances in Imaging and Electron Physics

Preț: 101177 lei

Preț vechi: 156231 lei
-35%

Puncte Express: 1518
Hardback (40) de la 000 lei

Carte tipărită la comandă

Livrare economică 01-15 iulie

Livrare prin curier în România Termenul estimat este afișat lângă disponibilitate.
Transport gratuit pentru acest produs Plată online sau ramburs, în funcție de opțiunile comenzii.
Retur gratuit în 14 zile Comandă securizată și suport în română.
 Adaugă în coș

Wish list
Gift list
Am citit!
Adaugă în listă

Specificații

ISBN-13: 9780128120873
ISBN-10: 0128120878
Pagini: 212
Dimensiuni: 152 x 229 x 16 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Cuprins

1. Convolution in (max; min)-Algebra and Its Role in Mathematical Morphology
Jesús Angulo
2. Critical Magnetic Field and Its Slope, Specific Heat, and Gap for Superconductivity as Modified by Nanoscopic Disorder
Clifford M. Krowne
3. Mirror Electron Microscopy
A. B. Bok, J. B. le Poole, J. Roos and H. de Lang

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE