Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 146
Autor Peter W. Hawkesen Limba Engleză Hardback – 12 iun 2007
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Specificații
ISBN-13: 9780123739087
ISBN-10: 012373908X
Pagini: 240
Ilustrații: Illustrated
Dimensiuni: 152 x 229 mm
Greutate: 0.56 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 012373908X
Pagini: 240
Ilustrații: Illustrated
Dimensiuni: 152 x 229 mm
Greutate: 0.56 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
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Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in generalCuprins
Spiral phase microscopy (S. Fürhapter et al.).LULU theory, idempotent stack filters and the mathematics of vision of Marr (C. Rohwer, M. Wild). Geometry of prior selection (H. Snoussi).
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE
Notă biografică
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.