Cantitate/Preț
Produs
Total produse
Vezi coșul
Advances in Imaging and Electron Physics de Peter W. Hawkes

Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 190

Peter W. Hawkes
en Limba Engleză Hardback – 5 iun 2015
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field
Citește tot Restrânge

Din seria Advances in Imaging and Electron Physics

Preț: 105163 lei

Preț vechi: 162513 lei
-35%

Puncte Express: 1577
Hardback (40) de la 000 lei

Carte tipărită la comandă

Livrare economică 02-16 iulie

Livrare prin curier în România Termenul estimat este afișat lângă disponibilitate.
Transport gratuit pentru acest produs Plată online sau ramburs, în funcție de opțiunile comenzii.
Retur gratuit în 14 zile Comandă securizată și suport în română.
 Adaugă în coș

Wish list
Gift list
Am citit!
Adaugă în listă

Specificații

ISBN-13: 9780128023808
ISBN-10: 0128023805
Pagini: 260
Dimensiuni: 152 x 229 x 18 mm
Greutate: 0.57 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Cuprins

  1. CISCEM 2014 Niels de Jonge
  2. Progress and Development of Direct Detectors for Cryo-Electron MicroscopyA. R. Faruqi, Richard Henderson, and Greg McMullan
  3. Electron Optics and Electron Microscopy Conference Proceedings and Abstracts: A Supplement Peter W. Hawkes
  4. Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the NanoscaleGrzegorz Wielgoszewski and Teodor Gotszalk

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE