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Advances in Imaging and Electron Physics de Peter W. Hawkes

Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 188

Peter W. Hawkes
en Limba Engleză Hardback – 15 apr 2015
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field
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Specificații

ISBN-13: 9780128022542
ISBN-10: 012802254X
Pagini: 232
Dimensiuni: 152 x 229 x 15 mm
Greutate: 0.48 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Cuprins

  1. Pattern Generators for Reflective Electron-Beam Lithography (REBL)Allen M. Carroll
  2. Recent Developments in Time-of-Flight Mass SpectrometryFrank Gunzer and Jürgen Grotemeyer
  3. A Special Voice Transform, Analytic Wavelets, and Zernike FunctionsMargit Pap
  4. The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and ImagingColin Sheppard

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE