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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles de Peter W. Hawkes

Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles: Advances in Imaging and Electron Physics, cartea 166

Peter W. Hawkes
en Limba Engleză Hardback – 28 iul 2011
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.


  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians
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Specificații

ISBN-13: 9780123813107
ISBN-10: 0123813107
Pagini: 752
Dimensiuni: 152 x 229 x 50 mm
Greutate: 1.17 kg
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Cuprins

  1. Beam equations
  2. Exact solutions to the beam equations
  3. Anti-paraxial expansions
  4. Solution of the beam formation problem in 3D case
  5. Asymptotic theory of 3D flows
  6. Geometrized theory
  7. Examples of applications

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE

Notă biografică

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.