Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 152
Peter W. Hawkesen Limba Engleză Hardback – 12 sep 2008
- Updated with contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians
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Specificații
ISBN-13: 9780123742193
ISBN-10: 0123742196
Pagini: 376
Ilustrații: Approx. 130 illustrations
Dimensiuni: 152 x 229 mm
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0123742196
Pagini: 376
Ilustrații: Approx. 130 illustrations
Dimensiuni: 152 x 229 mm
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in generalCuprins
Complex-valued neural network and complex-valued BP, by T. Nitta'Disorder', structured diffuse scattering and local crystal chemistry, by R.L. WithersNonlinear systems for image processing, by S. Morfu et al.The Foldy-Wouthuysen transformation technique in optics, by S.A. KhanStack filters: from definition to design algorithms, by N. HirataBlind source separation: the sparsity revolution, by J-L. Sparck et al.
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE