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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers de Peter W. Hawkes

Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: Advances in Imaging and Electron Physics, cartea 168

Peter W. Hawkes
en Limba Engleză Hardback – 27 sep 2011
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians
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Specificații

ISBN-13: 9780123859839
ISBN-10: 0123859832
Pagini: 392
Dimensiuni: 152 x 229 x 23 mm
Greutate: 0.54 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Cuprins

  1. The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach LucaGeretti, AntonioAbramo
  2. Logarithmic Image Processing for Color Images M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs
  3. Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography Rainer A. Leitgeb
  4. Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy S.A. Nepijko, G. Schönhense
  5. Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging Chad M. Parish
  6. Aberration Correctors developed under Triple C Project Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga
  7. Spatially resolved thermoluminescence in a scanning electron microscope
T. Schulz, M. Albrecht, K.Irmscher

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE