Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 170
Peter W. Hawkesen Limba Engleză Hardback – 20 mar 2012
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Preț: 1015.06 lei
Preț vechi: 1571.97 lei
-35% Nou
Puncte Express: 1523
Preț estimativ în valută:
179.67€ • 209.21$ • 156.91£
179.67€ • 209.21$ • 156.91£
Carte tipărită la comandă
Livrare economică 14-28 ianuarie 26
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9780123943965
ISBN-10: 0123943965
Pagini: 280
Dimensiuni: 152 x 229 x 23 mm
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0123943965
Pagini: 280
Dimensiuni: 152 x 229 x 23 mm
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in generalCuprins
- Precession Electron DiffractionA. S. Eggeman and P. A. Midgley
- Scanning Helium Ion MicroscopyR. Hill, J. A. Notte, and L. Scipioni
- Signal reconstruction algorithm based on a single intensity in the Fresnel domainHone-Ene Hwang, Pin Han
- Electron Microscopy Studies on Magnetic L10 FePd NanoparticlesKazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
- Fundamental aspects of Near Field Emission Scanning Electron MicroscopyD. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE