Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 151
Peter W. Hawkesen Limba Engleză Hardback – 3 iun 2008
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Specificații
ISBN-13: 9780123742186
ISBN-10: 0123742188
Pagini: 440
Ilustrații: Illustrated
Dimensiuni: 152 x 229 x 31 mm
Greutate: 0.88 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0123742188
Pagini: 440
Ilustrații: Illustrated
Dimensiuni: 152 x 229 x 31 mm
Greutate: 0.88 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in generalCuprins
Bontus & Köhler: Reconstruction Algorithms for Computed TomographyBusin, Vandenbroucke & Macaire: Color spaces and image segmentationEasley & Colonna: Generalized discrete Radon transforms and applications to image processing Radlicka: Lie algebraic methods in charged particle opticsRandle: Recent developments in electron backscatter diffraction
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE