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Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 206

Peter W. Hawkes
en Limba Engleză Hardback – 25 iun 2018
Advances in Imaging and Electron Physics, Volume 206, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.


  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
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Specificații

ISBN-13: 9780128152164
ISBN-10: 0128152168
Pagini: 338
Dimensiuni: 152 x 229 x 24 mm
Greutate: 0.62 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics


Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Cuprins

1. Holography and Tomography with Electrons
Axel Lubk
2. Paraxial Quantum Mechanics
Axel Lubk
3. Tomography
Axel Lubk
4. Electron Optics in Phase Space
Axel Lubk
5. Electron Holography in Phase Space
Axel Lubk
6. Electron Holographic Tomography
Axel Lubk
7. Summary and Outlook
Axel Lubk

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE