Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: Advances in Imaging and Electron Physics, cartea 162
Peter W. Hawkesen Limba Engleză Hardback – 6 aug 2010
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians
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Specificații
ISBN-13: 9780123813169
ISBN-10: 0123813166
Pagini: 296
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.52 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0123813166
Pagini: 296
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.52 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
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Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in generalCuprins
1. Energy Filtered X-ray Photoemission electronmicroscopy(EXPEEM)- Kiyotaka Asakura
2. Image contrast in aberration-corrected scanningconfocal electron microscopy- E.C. Cosgriff
3. Comparison of color demosaicing methods- O. Lossona
4. New dimensions for field emission: effects of structure in the emitting surface- C. J. Edgcombe
5. Conductivity Imaging and Generalised RadonTransform: a review- Archontis Giannakidis
6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy- A. Sever Škapin
2. Image contrast in aberration-corrected scanningconfocal electron microscopy- E.C. Cosgriff
3. Comparison of color demosaicing methods- O. Lossona
4. New dimensions for field emission: effects of structure in the emitting surface- C. J. Edgcombe
5. Conductivity Imaging and Generalised RadonTransform: a review- Archontis Giannakidis
6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy- A. Sever Škapin
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE
Notă biografică
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.