Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 193
Peter W. Hawkesen Limba Engleză Hardback – 2 feb 2016
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
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Specificații
ISBN-13: 9780128048153
ISBN-10: 0128048158
Pagini: 154
Dimensiuni: 152 x 229 x 15 mm
Greutate: 0.43 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0128048158
Pagini: 154
Dimensiuni: 152 x 229 x 15 mm
Greutate: 0.43 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Cuprins
1. Utilizing the Eigen-Emittance Concept for Bright Electron BeamsLeanne D. Duffy and Alex J. Dragt2. Analytical Methods for the Calculation and Simulation of New Schemes of Static and Time-of-Flight Mass Spectrometers Igor Spivak-Lavrov
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE