Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 158
Peter W. Hawkesen Limba Engleză Hardback – 10 sep 2009
- Updated with contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Provides an invaluable reference and guide for physicists, engineers and mathematicians
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Specificații
ISBN-13: 9780123747693
ISBN-10: 0123747694
Pagini: 320
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.54 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0123747694
Pagini: 320
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.54 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in generalCuprins
1, Surface plasmon enhanced photoemission and electron acceleration with ultrashort laser pulses,
Dombi*
2, Physics and the Pioneers of Microscopy,
Ford*
3, Image decomposition: theory, numerical schemes and performance evaluation,
Gilles*
4, The reverse fuzzy distance transform and its use when studying the shape of macromolecules from cryo-electron tomographic data, Svensson*
5, Anchors of Morphological Operators and Algebraic Openings,
Roogenbroeck*
6, Temporal Filtering Technique using Time Lenses for Optical Transmission Systems, Yang, Kumar, Wang
Dombi*
2, Physics and the Pioneers of Microscopy,
Ford*
3, Image decomposition: theory, numerical schemes and performance evaluation,
Gilles*
4, The reverse fuzzy distance transform and its use when studying the shape of macromolecules from cryo-electron tomographic data, Svensson*
5, Anchors of Morphological Operators and Algebraic Openings,
Roogenbroeck*
6, Temporal Filtering Technique using Time Lenses for Optical Transmission Systems, Yang, Kumar, Wang
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE
Notă biografică
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.