Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 179
Peter W. Hawkesen Limba Engleză Hardback – 12 sep 2013
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
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Specificații
ISBN-13: 9780124077003
ISBN-10: 0124077005
Pagini: 410
Dimensiuni: 152 x 229 x 27 mm
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0124077005
Pagini: 410
Dimensiuni: 152 x 229 x 27 mm
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
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Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.Cuprins
- Invariant Quantum Wave Equations and Double Space-TimeClaude Daviau
- In-Situ and Correlative Electron MicroscopyNiels de Jonge
- Electron Tweezers as a Tool for High Precision Manipulation of NanoobjectsVladimir P. Oleshko and James M. Howe
- Robustness Analysis of the Reduced Fuzzy Texture Spectrum and its Performance on Noisy ImagesPilar Sobrevilla , Eduard Montseny, and Aina Barcelo
- Measure-by-Wire: An Automatic Control Framework for High-Throughput Transmission Electron MicroscopyArturo Tejada, Wouter Van den Broek, and Arnold J. den Dekker
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE