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Advances in Imaging and Electron Physics de Peter W. Hawkes

Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 202

Peter W. Hawkes
en Limba Engleză Hardback – 30 aug 2017
Advances in Imaging and Electron Physics, Volume 202, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.


  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
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Specificații

ISBN-13: 9780128120880
ISBN-10: 0128120886
Pagini: 166
Dimensiuni: 152 x 229 x 15 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Cuprins

1. Non-Negative Sparse Mathematical Morphology
Jesús Angulo and Santiago Velasco-Forero
2. Disorder Modifications of the Critical Temperature for Superconductivity – A　Perspective from the Point of View of Nanoscience
Clifford M. Krowne
3. The Struggle to Overcome Spherical Aberration in Electron Optics
Albert Septier

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE