Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 202
Peter W. Hawkesen Limba Engleză Hardback – 30 aug 2017
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
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Specificații
ISBN-13: 9780128120880
ISBN-10: 0128120886
Pagini: 166
Dimensiuni: 152 x 229 x 15 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0128120886
Pagini: 166
Dimensiuni: 152 x 229 x 15 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
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Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.Cuprins
1. Non-Negative Sparse Mathematical Morphology
Jesús Angulo and Santiago Velasco-Forero
2. Disorder Modifications of the Critical Temperature for Superconductivity – A Perspective from the Point of View of Nanoscience
Clifford M. Krowne
3. The Struggle to Overcome Spherical Aberration in Electron Optics
Albert Septier
Jesús Angulo and Santiago Velasco-Forero
2. Disorder Modifications of the Critical Temperature for Superconductivity – A Perspective from the Point of View of Nanoscience
Clifford M. Krowne
3. The Struggle to Overcome Spherical Aberration in Electron Optics
Albert Septier
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE
Notă biografică
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.