Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 140
Autor Peter W. Hawkesen Limba Engleză Hardback – 15 iun 2006
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Specificații
ISBN-13: 9780120147823
ISBN-10: 0120147823
Pagini: 336
Ilustrații: Approx. 100 illustrations
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.65 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0120147823
Pagini: 336
Ilustrații: Approx. 100 illustrations
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.65 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.Cuprins
Preface
Future contributions
Recursive Neural Networks and Their Applications to Image Processing
Deterministic Learning and an Application in Optimal Control
X-Ray Fluorescence Holography
A Taxonomy of Color Image Filtering and Enhancement Solutions
General Sweep Mathematical Morphology
Index
Future contributions
Recursive Neural Networks and Their Applications to Image Processing
Deterministic Learning and an Application in Optimal Control
X-Ray Fluorescence Holography
A Taxonomy of Color Image Filtering and Enhancement Solutions
General Sweep Mathematical Morphology
Index
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE