Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 140
Autor Peter W. Hawkesen Limba Engleză Hardback – 15 iun 2006
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Specificații
ISBN-13: 9780120147823
ISBN-10: 0120147823
Pagini: 336
Ilustrații: Approx. 100 illustrations
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.65 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0120147823
Pagini: 336
Ilustrații: Approx. 100 illustrations
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.65 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.Cuprins
Preface
Future contributions
Recursive Neural Networks and Their Applications to Image Processing
Deterministic Learning and an Application in Optimal Control
X-Ray Fluorescence Holography
A Taxonomy of Color Image Filtering and Enhancement Solutions
General Sweep Mathematical Morphology
Index
Future contributions
Recursive Neural Networks and Their Applications to Image Processing
Deterministic Learning and an Application in Optimal Control
X-Ray Fluorescence Holography
A Taxonomy of Color Image Filtering and Enhancement Solutions
General Sweep Mathematical Morphology
Index
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE
Notă biografică
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.