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Advances in Imaging and Electron Physics de Peter W. Hawkes

Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 197

Autor Peter W. Hawkes
en Limba Engleză Hardback – 14 oct 2016
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.


  • Contains contributions from leading authorities on imaging and electron physics that inform and update on the latest developments in the field
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
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Specificații

ISBN-13: 9780128048115
ISBN-10: 0128048115
Pagini: 174
Dimensiuni: 152 x 229 mm
Greutate: 0.5 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Cuprins

1. Interference of Light and Material Particles, a Departure from the Superposition Principle
R. Castañeda, G. Matteucci and R. Capelli
2. Unified Numerical Formalism of Modal Methods in Computational Electromagnetics and Latest Advances: Applications in Nanophotonics and Plasmonics
K. Edee, J.P. Plumey and B. Guizal
3. Fundamentals of Focal Series Inline Electron Holography
A. Lubk, K. Vogel, D. Wolf, J. Krehl, F. Röder, L. Clark, G. Guzzinati and J. Verbeeck

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE