Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 199
Peter W. Hawkesen Limba Engleză Hardback – 20 mar 2017
In addition, topics of interest, including electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains are presented and discussed.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
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Specificații
ISBN-13: 9780128120910
ISBN-10: 0128120916
Pagini: 324
Dimensiuni: 152 x 229 mm
Greutate: 0.6 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0128120916
Pagini: 324
Dimensiuni: 152 x 229 mm
Greutate: 0.6 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.Cuprins
1. Micro-XRF in Scanning Electron MicroscopesM. Haschke and S. Boehm2. A Variational Approach for Simulation of Equilibrium Ion Distributions in Ion Traps with Regard to Coulomb InteractionI.A. Kopaev, D. Grinfeld, M.A. Monastyrskiy, R.S. Ablizen, S.S. Alimpiev and A.A. Trubitsyn3. Analytical Review of Direct STEM Imaging Techniques for Thin SamplesI. Lazić and E.G.T. Bosch4. Quantum Nano-Optics in the Electron MicroscopeL.H.G. Tizei and M. Kociak5. Component Identification and Interpretation: A Perspective on Tower of KnowledgeM. Xu, J. Ren and Z. Wang
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE