Advances in Imaging and Electron Physics: Aberration-corrected Electron Microscopy: Advances in Imaging and Electron Physics, cartea 153
Peter W. Hawkesen Limba Engleză Hardback – 18 dec 2008
- First book on the subject of correctors
- Well known contributors from academia and microscope manufacturers
- Provides an ideal starting point for preparing funding proposals
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Specificații
ISBN-13: 9780123742209
ISBN-10: 012374220X
Pagini: 590
Dimensiuni: 152 x 229 x 33 mm
Greutate: 1.04 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 012374220X
Pagini: 590
Dimensiuni: 152 x 229 x 33 mm
Greutate: 1.04 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
All users of electron microscopes as well as physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.Cuprins
History of aberration correction in electron microscopy (H. Rose)Present and future hexapole aberration correctors for high resolution electron microscopy (M. Haider)Aberration correction and STEM (O.L. Krivanek)First results using the Nion third order STEM corrector (P. Batson) STEM and EELS: Mapping materials atom by atom (A.B. Bleloch) Aberration correction with the SACTEM-Toulouse: from imaging to diffraction (F. Houdellier et al.) Novel aberration corrections concepts (B. Kabius) Aberration corrected imaging in CTEM and STEM (A. Kirkland et al.)Materials applications of aberration-corrected STEM (S.J. Pennycook et al.)Spherical aberration corrected transmission electron microscopy for nanomaterials in Japan (N. Tanaka)Atomic-resolution aberration-corrected transmission electron microscopy (K. Urban et al.) Aberration-corrected electron microscopes at Brookhaven National Laboratory (Y. Zhu and J. Wall)
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE
Notă biografică
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.