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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers de Peter W. Hawkes

Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: Advances in Imaging and Electron Physics, cartea 157

Peter W. Hawkes
en Limba Engleză Hardback – 3 noi 2009
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians
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Specificații

ISBN-13: 9780123747686
ISBN-10: 0123747686
Pagini: 373
Dimensiuni: 152 x 229 x 32 mm
Greutate: 0.76 kg
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Locul publicării:United Kingdom

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Cuprins

1. Charged particles in electromagnetic fields
2. Language of aberration expansions in charged particle optics
3. Transporting charged particle beams in static fields
4. Transporting charged particles in radiofrequency fields
5. Static magnetic charged particle analyzers
6. Electrostatic energy analyzers
7. Mass analyzers with combined electrostatic and magnetic fields
8. Time-of-flight mass analyzers
9. Radiofrequency mass analyzers

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE