Frontiers in Electronic Testing

Testability Concepts for Digital ICs: The Macro Test Approach

Frontiers in Electronic Testing, nr. 3

Autor F.P.M. Beenker et al.

30 noi 1995

Preț: 910^.58 lei 1110^.47 lei

6-8 săpt.

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Efficient Branch and Bound Search with Application to Computer-Aided Design

Frontiers in Electronic Testing, nr. 4

Autor Xinghao Chen et al.

31 dec 1995

Preț: 615^.35 lei 723^.94 lei

6-8 săpt.

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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

30 apr 1996

Preț: 615^.66 lei 724^.31 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 7

Editat de Yervant Zorian

4 oct 2012

Preț: 601^.82 lei 752^.27 lei

39-44 zile

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Frontiers in Electronic Testing, nr. 8

Autor S. Chakravarty et al.

30 iun 1997

Preț: 628^.56 lei 739^.48 lei

6-8 săpt.

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Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques

Frontiers in Electronic Testing, nr. 9

Autor Wolfgang Kunz et al.

30 iun 1997

Preț: 952^.45 lei 1190^.56 lei

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Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

6 dec 2010

Preț: 614^.60 lei 723^.05 lei

6-8 săpt.

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Formal Equivalence Checking and Design Debugging

Frontiers in Electronic Testing, nr. 12

Autor Shi-Yu Huang et al.

30 iun 1998

Preț: 1067^.07 lei 1301^.30 lei

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Research Perspectives and Case Studies in System Test and Diagnosis

Frontiers in Electronic Testing, nr. 13

Editat de John W. Sheppard et al.

30 sep 1998

Preț: 911^.64 lei 1111^.76 lei

6-8 săpt.

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Frontiers in Electronic Testing, nr. 14

Autor Angela Krstic et al.

31 oct 1998

Preț: 909^.82 lei 1109^.53 lei

6-8 săpt.

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Design for AT-Speed Test, Diagnosis and Measurement

Frontiers in Electronic Testing, nr. 15

Editat de Benoit Nadeau-Dostie

30 sep 1999

Preț: 915^.73 lei 1116^.74 lei

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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 16

Editat de Adam Osseiran

31 oct 1999

Preț: 908^.14 lei 1107^.48 lei

6-8 săpt.

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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Frontiers in Electronic Testing, nr. 17

Autor M. Bushnell et al.

7 apr 2013

Preț: 777^.43 lei 948^.10 lei

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Frontiers in Electronic Testing, nr. 18

Autor José T. de Sousa et al.

28 feb 2001

Preț: 909^.08 lei 1108^.63 lei

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A Designer’s Guide to Built-In Self-Test

Frontiers in Electronic Testing, nr. 19

Autor Charles E. Stroud

31 mai 2002

Preț: 1178^.53 lei 1437^.23 lei

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Test Resource Partitioning for System-on-a-Chip

Frontiers in Electronic Testing, nr. 20

Autor Vikram Iyengar et al.

30 iun 2002

Preț: 619^.61 lei 728^.96 lei

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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Frontiers in Electronic Testing, nr. 21

Autor Krishnendu Chakrabarty

30 sep 2002

Preț: 624^.77 lei 735^.03 lei

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Frontiers in Electronic Testing, nr. 21

Autor R. Bartl et al.

Preț: 569^.21 lei 599^.17 lei

Indisponibil temporar

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 22B

Autor Nicola Nicolici et al.

28 feb 2003

Preț: 617^.72 lei 726^.72 lei

6-8 săpt.

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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Frontiers in Electronic Testing, nr. 22A

Autor R. Dean Adams

26 apr 2013

Preț: 906^.47 lei 1105^.45 lei

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Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Frontiers in Electronic Testing, nr. 23

Editat de Alfredo Benso et al.

31 oct 2003

Preț: 911^.78 lei 1111^.92 lei

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Elements of STIL: Principles and Applications of IEEE Std. 1450

Frontiers in Electronic Testing, nr. 24

Autor Gregory A. Maston et al.

31 oct 2003

Preț: 916^.64 lei 1117^.85 lei

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Verification by Error Modeling: Using Testing Techniques in Hardware Verification

Frontiers in Electronic Testing, nr. 25

Autor Katarzyna Radecka et al.

30 noi 2003

Preț: 620^.23 lei 729^.69 lei

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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Frontiers in Electronic Testing, nr. 26

Autor Said Hamdioui

31 mar 2004

Preț: 619^.45 lei 728^.76 lei

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Advances in Electronic Testing: Challenges and Methodologies

Frontiers in Electronic Testing, nr. 27

Editat de Dimitris Gizopoulos

5 dec 2014

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Frontiers in Electronic Testing, nr. 28

Autor Dimitris Gizopoulos et al.

20 dec 2004

Preț: 951^.83 lei 1189^.79 lei

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Introduction to Advanced System-on-Chip Test Design and Optimization

Frontiers in Electronic Testing, nr. 29

Autor Erik Larsson

7 noi 2005

Preț: 930^.44 lei 1134^.68 lei

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Fault Diagnosis of Analog Integrated Circuits

Frontiers in Electronic Testing, nr. 30

Autor Prithviraj Kabisatpathy et al.

5 ian 2011

Preț: 610^.96 lei 718^.77 lei

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Frontiers in Electronic Testing, nr. 31

Autor Leendert M. Huisman

21 iun 2005

Preț: 621^.17 lei 730^.79 lei

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Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

29 noi 2010

Preț: 611^.12 lei 718^.97 lei

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Digital Timing Measurements: From Scopes and Probes to Timing and Jitter

Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

11 aug 2006

Preț: 914^.06 lei 1114^.71 lei

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing, nr. 34

Autor Manoj Sachdev et al.

10 noi 2010

Preț: 1172^.00 lei 1429^.28 lei

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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500™

Frontiers in Electronic Testing, nr. 35

Autor Francisco da Silva et al.

20 oct 2014

Preț: 670^.52 lei 788^.84 lei

6-8 săpt.

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Oscillation-Based Test in Mixed-Signal Circuits

Frontiers in Electronic Testing, nr. 36

Autor Gloria Huertas Sánchez et al.

6 noi 2006

Preț: 921^.81 lei 1124^.15 lei

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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

Frontiers in Electronic Testing, nr. 37

Editat de Mohammad Tehranipoor

10 dec 2007

Preț: 921^.04 lei 1123^.22 lei

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Timing Performance of Nanometer Digital Circuits Under Process Variations

Frontiers in Electronic Testing, nr. 39

Autor Victor Champac et al.

27 apr 2018

Preț: 700^.11 lei 853^.79 lei

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Frontiers in Electronic Testing, nr. 40

Autor Andrei Pavlov et al.

28 oct 2010

Preț: 956^.38 lei 1166^.31 lei

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Soft Errors in Modern Electronic Systems

Frontiers in Electronic Testing, nr. 41

Editat de Michael Nicolaidis

5 noi 2012

Preț: 852^.60 lei 1121^.84 lei

39-44 zile

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Frontiers in Electronic Testing, nr. 42

Autor Michael Gössel et al.

9 mai 2008

Preț: 616^.77 lei 725^.62 lei

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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault

Frontiers in Electronic Testing, nr. 43

Editat de Hans-Joachim Wunderlich

mar 2012

Preț: 619^.45 lei 774^.30 lei

6-8 săpt.

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Frontiers in Electronic Testing