Filtre: Springer

Frontiers in Electronic Testing

From Contamination to Defects, Faults and Yield Loss

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

30 apr 1996

Preț: 659^.45 lei 775^.82 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 8

Autor S. Chakravarty et al.

30 iun 1997

Preț: 669^.04 lei 787^.11 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

6 dec 2010

Preț: 629^.86 lei 741^.01 lei

6-8 săpt.

-15%

Formal Equivalence Checking and Design Debugging

Frontiers in Electronic Testing, nr. 12

Autor Shi-Yu Huang et al.

30 iun 1998

Preț: 1146^.10 lei 1397^.68 lei

6-8 săpt.

-18%

Research Perspectives and Case Studies in System Test and Diagnosis

Frontiers in Electronic Testing, nr. 13

Editat de William R. Simpson et al.

30 sep 1998

Preț: 977^.52 lei 1192^.10 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 14

Autor Kwang-Ting (Tim) Cheng et al.

31 oct 1998

Preț: 975^.42 lei 1189^.54 lei

6-8 săpt.

-18%

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Frontiers in Electronic Testing, nr. 17

Autor Vishwani Agrawal et al.

7 apr 2013

Preț: 783^.34 lei 955^.29 lei

6-8 săpt.

-18%

Test Resource Partitioning for System-on-a-Chip

Frontiers in Electronic Testing, nr. 20

Autor Vikram Iyengar et al.

7 noi 2012

Preț: 616^.36 lei 725^.13 lei

6-8 săpt.

-15%

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Frontiers in Electronic Testing, nr. 21

Autor Krishnendu Chakrabarty

30 sep 2002

Preț: 674^.85 lei 793^.94 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 24

Autor Gregory A. Maston et al.

31 oct 2003

Preț: 985^.92 lei 1202^.34 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 25

Autor Katarzyna Radecka et al.

30 noi 2003

Preț: 662^.95 lei 779^.94 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 26

Autor Said Hamdioui

31 mar 2004

Preț: 663^.36 lei 780^.42 lei

6-8 săpt.

-15%

Introduction to Advanced System-on-Chip Test Design and Optimization

Frontiers in Electronic Testing, nr. 29

Autor Erik Larsson

7 noi 2005

Preț: 985^.74 lei 1202^.12 lei

6-8 săpt.

-18%

Fault Diagnosis of Analog Integrated Circuits

Frontiers in Electronic Testing, nr. 30

Autor Prithviraj Kabisatpathy et al.

5 ian 2011

Preț: 616^.67 lei 725^.50 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 31

Autor Leendert M. Huisman

21 iun 2005

Preț: 668^.28 lei 786^.20 lei

6-8 săpt.

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Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

29 noi 2010

Preț: 614^.98 lei 723^.51 lei

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Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

25 noi 2010

Preț: 914^.98 lei 1115^.84 lei

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing, nr. 34

Autor Manoj Sachdev et al.

10 noi 2010

Preț: 1224^.46 lei 1493^.25 lei

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Frontiers in Electronic Testing, nr. 35

Autor Francisco Da Silva et al.

20 oct 2014

Preț: 701^.49 lei 825^.27 lei

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Frontiers in Electronic Testing, nr. 37

Editat de Mohammad Tehranipoor

10 dec 2007

Preț: 991^.61 lei 1209^.28 lei

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Soft Errors in Modern Electronic Systems

Frontiers in Electronic Testing, nr. 41

Editat de Michael Nicolaidis

5 noi 2012

Preț: 834^.71 lei 917^.26 lei

Indisponibil temporar

-9%

Frontiers in Electronic Testing

From Contamination to Defects, Faults and Yield Loss

Introduction to IDDQ Testing

On-Line Testing for VLSI

Formal Equivalence Checking and Design Debugging

Research Perspectives and Case Studies in System Test and Diagnosis

Delay Fault Testing for VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Test Resource Partitioning for System-on-a-Chip

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Elements of STIL

Verification by Error Modeling

Testing Static Random Access Memories

Introduction to Advanced System-on-Chip Test Design and Optimization

Fault Diagnosis of Analog Integrated Circuits

Data Mining and Diagnosing IC Fails

Fault-Tolerance Techniques for SRAM-Based FPGAs

Digital Timing Measurements

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

The Core Test Wrapper Handbook

Emerging Nanotechnologies

Soft Errors in Modern Electronic Systems

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