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Digital Timing Measurements: From Scopes and Probes to Timing and Jitter: Frontiers in Electronic Testing, cartea 33

Autor Wolfgang Maichen
en Limba Engleză Paperback – 25 noi 2010
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this endeavour, an engineer needs a knowledge base covering instrumentation, measurement techniques, signal integrity, jitter and timing concepts, and statistics. Very often even the most experienced digital test engineers, while mastering some of those subjects, lack systematic knowledge or experience in the high speed signal area.
Digital Timing Measurements gives a compact, practice-oriented overview on all those subjects. The emphasis is on useable concepts and real-life guidelines that can be readily put into practice, with references to the underlying mathematical theory. It unites in one place a variety of information relevant to high speed testing, measurement, signal fidelity, and instrumentation.
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Specificații

ISBN-13: 9781441940667
ISBN-10: 1441940669
Pagini: 256
Ilustrații: XIV, 240 p.
Dimensiuni: 160 x 240 x 17 mm
Greutate: 0.36 kg
Ediția:Softcover reprint of hardcover 1st ed. 2006
Editura: Springer Us
Colecția Springer
Seria Frontiers in Electronic Testing

Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

Chapter I: Electrical Basics. 1. Time domain and frequency domain. 2. Transmission line theory.- Chapter II: Measurement Hardware. 1. Oscilloscopes and CO. 2. Key instrument parameters. 3. Probes. 4. Accessories.- Chapter III: Timing and Jitter. 1. Statistical basics. 2. Rise time measurements. 3. Understanding jitter. 4. Jitter Analysis.- Chapter IV: Measurement Accuracy. 1. Specialized Measurement Techniques. 2. Digital Signal Processing.- References.- Index.

Caracteristici

Very practice-oriented introduction into timing and jitter measurements Written from a test and characterization engineer’s perspective Assembles a set of relevant topics that are usually widely scattered Saves time and effort because it concentrates on the vital essence Enables further study through extensive references Includes supplementary material: sn.pub/extras