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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test de R. Dean Adams

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test: Frontiers in Electronic Testing, cartea 22A

Autor R. Dean Adams
en Limba Engleză Paperback – 26 apr 2013
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
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Specificații

ISBN-13: 9781475784749
ISBN-10: 1475784740
Pagini: 264
Ilustrații: XIV, 250 p.
Dimensiuni: 155 x 235 x 14 mm
Greutate: 0.38 kg
Ediția:2003
Editura: Springer Us
Colecția Springer
Seria Frontiers in Electronic Testing

Locul publicării:New York, NY, United States

Public țintă

Professional/practitioner

Cuprins

Test of Memories.- Opening Pandora’s Box.- Static Random Access Memories.- Multi-Port Memories.- Silicon On Insulator Memories.- Content Addressable Memories.- Dynamic Random Access Memories.- Non-Volatile Memories.- Memory Testing.- Memory Faults.- Memory Patterns.- Memory Self Test.- BIST Concepts.- State Machine BIST.- Micro-Code BIST.- BIST and Redundancy.- Design For Test and BIST.- Conclusions.

Recenzii

From the reviews:
"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)