Frontiers in Electronic Testing

Frontiers in Electronic Testing, nr. 3

Autor F. P. M. Beenker et al.

30 noi 1995

Preț: 976^.26 lei 1190^.55 lei

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Efficient Branch and Bound Search with Application to Computer-Aided Design

Frontiers in Electronic Testing, nr. 4

Autor Michael L. Bushnell et al.

31 dec 1995

Preț: 659^.00 lei 775^.29 lei

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From Contamination to Defects, Faults and Yield Loss

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

30 apr 1996

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Frontiers in Electronic Testing, nr. 7

Editat de Yervant Zorian

4 oct 2012

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Frontiers in Electronic Testing, nr. 8

Autor S. Chakravarty et al.

30 iun 1997

Preț: 669^.04 lei 787^.11 lei

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Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques

Frontiers in Electronic Testing, nr. 9

Autor Wolfgang Kunz et al.

7 dec 2010

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Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

6 dec 2010

Preț: 629^.86 lei 741^.01 lei

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Formal Equivalence Checking and Design Debugging

Frontiers in Electronic Testing, nr. 12

Autor Shi-Yu Huang et al.

30 iun 1998

Preț: 1146^.10 lei 1397^.68 lei

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Research Perspectives and Case Studies in System Test and Diagnosis

Frontiers in Electronic Testing, nr. 13

Editat de William R. Simpson et al.

30 sep 1998

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Frontiers in Electronic Testing, nr. 14

Autor Kwang-Ting (Tim) Cheng et al.

31 oct 1998

Preț: 975^.42 lei 1189^.54 lei

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Design for AT-Speed Test, Diagnosis and Measurement

Frontiers in Electronic Testing, nr. 15

Editat de Benoit Nadeau-Dostie

30 sep 1999

Preț: 982^.28 lei 1197^.90 lei

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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 16

Editat de Adam Osseiran

10 dec 2010

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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Frontiers in Electronic Testing, nr. 17

Autor Vishwani Agrawal et al.

7 apr 2013

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Frontiers in Electronic Testing, nr. 18

Autor Peter Y. K. Cheung et al.

28 feb 2001

Preț: 974^.57 lei 1188^.50 lei

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A Designer's Guide to Built-In Self-Test

Frontiers in Electronic Testing, nr. 19

Autor Charles E. Stroud

31 mai 2002

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Test Resource Partitioning for System-on-a-Chip

Frontiers in Electronic Testing, nr. 20

Autor Vikram Iyengar et al.

7 noi 2012

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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Frontiers in Electronic Testing, nr. 21

Autor Krishnendu Chakrabarty

30 sep 2002

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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Frontiers in Electronic Testing, nr. 22A

Autor R. Dean Adams

26 apr 2013

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Power-Constrained Testing of VLSI Circuits

Frontiers in Electronic Testing, nr. 22B

Autor Bashir M. Al-Hashimi et al.

28 feb 2003

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Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Frontiers in Electronic Testing, nr. 23

Editat de Paolo Prinetto et al.

31 oct 2003

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Frontiers in Electronic Testing, nr. 24

Autor Gregory A. Maston et al.

31 oct 2003

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Frontiers in Electronic Testing, nr. 25

Autor Katarzyna Radecka et al.

30 noi 2003

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Frontiers in Electronic Testing, nr. 26

Autor Said Hamdioui

31 mar 2004

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Advances in Electronic Testing: Challenges and Methodologies

Frontiers in Electronic Testing, nr. 27

Editat de Dimitris Gizopoulos

5 dec 2014

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Frontiers in Electronic Testing, nr. 28

Autor Dimitris Gizopoulos et al.

20 dec 2004

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Introduction to Advanced System-on-Chip Test Design and Optimization

Frontiers in Electronic Testing, nr. 29

Autor Erik Larsson

7 noi 2005

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Fault Diagnosis of Analog Integrated Circuits

Frontiers in Electronic Testing, nr. 30

Autor Prithviraj Kabisatpathy et al.

5 ian 2011

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Frontiers in Electronic Testing, nr. 31

Autor Leendert M. Huisman

21 iun 2005

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Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

29 noi 2010

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Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

25 noi 2010

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing, nr. 34

Autor Manoj Sachdev et al.

10 noi 2010

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Frontiers in Electronic Testing, nr. 35

Autor Francisco Da Silva et al.

20 oct 2014

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Oscillation-Based Test in Mixed-Signal Circuits

Frontiers in Electronic Testing, nr. 36

Autor Gloria Huertas Sánchez et al.

6 noi 2006

Preț: 921^.81 lei 1124^.15 lei

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Frontiers in Electronic Testing, nr. 37

Editat de Mohammad Tehranipoor

10 dec 2007

Preț: 991^.61 lei 1209^.28 lei

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Soft Errors in Modern Electronic Systems

Frontiers in Electronic Testing, nr. 41

Editat de Michael Nicolaidis

5 noi 2012

Preț: 834^.71 lei 917^.26 lei

Indisponibil temporar

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Frontiers in Electronic Testing

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