Filtre: Springer US, New York, N.Y.

Frontiers in Electronic Testing

Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques

Frontiers in Electronic Testing, nr. 9

Autor Wolfgang Kunz et al.

7 dec 2010

Preț: 946^.45 lei 1183^.06 lei

6-8 săpt.

-20%

Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 16

Editat de Adam Osseiran

10 dec 2010

Preț: 902^.39 lei 1100^.48 lei

6-8 săpt.

-18%

Fault Diagnosis of Analog Integrated Circuits

Frontiers in Electronic Testing, nr. 30

Autor Prithviraj Kabisatpathy et al.

5 ian 2011

Preț: 610^.96 lei 718^.77 lei

6-8 săpt.

-15%

Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

29 noi 2010

Preț: 611^.12 lei 718^.97 lei

6-8 săpt.

-15%

Digital Timing Measurements: From Scopes and Probes to Timing and Jitter

Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

25 noi 2010

Preț: 906^.03 lei 1104^.92 lei

6-8 săpt.

-18%