Filtre: Yervant Zorian

Frontiers in Electronic Testing

Multi-Chip Module Test Strategies

Frontiers in Electronic Testing, nr. 7

Editat de Yervant Zorian

4 oct 2012

Preț: 601^.34 lei 751^.68 lei

38-44 zile

-20%

On-Line Testing for VLSI

Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

6 dec 2010

Preț: 629^.86 lei 741^.01 lei

6-8 săpt.

-15%

Embedded Processor-Based Self-Test

Frontiers in Electronic Testing, nr. 28

Autor Dimitris Gizopoulos et al.

20 dec 2004

Preț: 979^.67 lei 1224^.60 lei

6-8 săpt. | 5-11 zile

-20%