Power-Aware Testing and Test Strategies for Low Power Devices
Editat de Patrick Girard et al.
5 sep 2014
Paperback
Preț: 674.15 lei 793.12 lei
6-8 săpt.
-15%
Cărți de Nicola Nicolici
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
Autor Nicola Nicolici et al.
28 feb 2003
Hardback
Preț: 617.72 lei 726.72 lei
6-8 săpt.
-15%