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Frontiers in Electronic Testing

Testability Concepts for Digital ICs: The Macro Test Approach

Frontiers in Electronic Testing, nr. 3

Autor F.P.M. Beenker et al.

4 oct 2012

Preț: 904^.83 lei 1103^.45 lei

6-8 săpt.

-18%

Efficient Branch and Bound Search with Application to Computer-Aided Design

Frontiers in Electronic Testing, nr. 4

Autor Xinghao Chen et al.

26 sep 2011

Preț: 609^.53 lei 717^.10 lei

6-8 săpt.

-15%

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

26 sep 2011

Preț: 609^.85 lei 717^.46 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 7

Editat de Yervant Zorian

4 oct 2012

Preț: 601^.82 lei 752^.27 lei

38-45 zile

-20%

Frontiers in Electronic Testing, nr. 8

Autor S. Chakravarty et al.

12 oct 2012

Preț: 618^.03 lei 727^.08 lei

6-8 săpt.

-15%

Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques

Frontiers in Electronic Testing, nr. 9

Autor Wolfgang Kunz et al.

30 iun 1997

Preț: 952^.45 lei 1190^.56 lei

6-8 săpt.

-20%

Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

6 dec 2010

Preț: 614^.60 lei 723^.05 lei

6-8 săpt.

-15%

Formal Equivalence Checking and Design Debugging

Frontiers in Electronic Testing, nr. 12

Autor Shi-Yu Huang et al.

30 sep 2012

Preț: 1062^.83 lei 1296^.12 lei

6-8 săpt.

-18%

Research Perspectives and Case Studies in System Test and Diagnosis

Frontiers in Electronic Testing, nr. 13

Editat de John W. Sheppard et al.

26 oct 2012

Preț: 905^.74 lei 1104^.56 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 14

Autor Angela Krstic et al.

12 oct 2012

Preț: 903^.90 lei 1102^.31 lei

6-8 săpt.

-18%

Design for AT-Speed Test, Diagnosis and Measurement

Frontiers in Electronic Testing, nr. 15

Editat de Benoit Nadeau-Dostie

26 apr 2013

Preț: 909^.21 lei 1108^.79 lei

6-8 săpt.

-18%

Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 16

Editat de Adam Osseiran

31 oct 1999

Preț: 908^.14 lei 1107^.48 lei

6-8 săpt.

-18%

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Frontiers in Electronic Testing, nr. 17

Autor M. Bushnell et al.

7 apr 2013

Preț: 777^.43 lei 948^.10 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 18

Autor José T. de Sousa et al.

7 dec 2010

Preț: 903^.16 lei 1101^.42 lei

6-8 săpt.

-18%

A Designer’s Guide to Built-In Self-Test

Frontiers in Electronic Testing, nr. 19

Autor Charles E. Stroud

18 mar 2013

Preț: 1171^.58 lei 1428^.76 lei

6-8 săpt.

-18%

Test Resource Partitioning for System-on-a-Chip

Frontiers in Electronic Testing, nr. 20

Autor Vikram Iyengar et al.

30 iun 2002

Preț: 619^.61 lei 728^.96 lei

6-8 săpt.

-15%

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Frontiers in Electronic Testing, nr. 21

Autor Krishnendu Chakrabarty

12 dec 2011

Preț: 614^.24 lei 722^.63 lei

6-8 săpt.

-15%

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 22B

Autor Nicola Nicolici et al.

9 dec 2010

Preț: 610^.82 lei 718^.61 lei

6-8 săpt.

-15%

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Frontiers in Electronic Testing, nr. 22A

Autor R. Dean Adams

26 apr 2013

Preț: 906^.47 lei 1105^.45 lei

6-8 săpt.

-18%

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Frontiers in Electronic Testing, nr. 23

Editat de Alfredo Benso et al.

7 dec 2010

Preț: 906^.03 lei 1104^.92 lei

6-8 săpt.

-18%

Elements of STIL: Principles and Applications of IEEE Std. 1450

Frontiers in Electronic Testing, nr. 24

Autor Gregory A. Maston et al.

30 oct 2012

Preț: 908^.77 lei 1108^.26 lei

6-8 săpt.

-18%

Verification by Error Modeling: Using Testing Techniques in Hardware Verification

Frontiers in Electronic Testing, nr. 25

Autor Katarzyna Radecka et al.

7 dec 2010

Preț: 612^.68 lei 720^.80 lei

6-8 săpt.

-15%

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Frontiers in Electronic Testing, nr. 26

Autor Said Hamdioui

9 dec 2010

Preț: 613^.18 lei 721^.38 lei

6-8 săpt.

-15%

Advances in Electronic Testing: Challenges and Methodologies

Frontiers in Electronic Testing, nr. 27

Editat de Dimitris Gizopoulos

5 dec 2014

Preț: 914^.35 lei 1115^.06 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 28

Autor Dimitris Gizopoulos et al.

14 dec 2011

Preț: 945^.81 lei 1182^.26 lei

6-8 săpt.

-20%

Introduction to Advanced System-on-Chip Test Design and Optimization

Frontiers in Electronic Testing, nr. 29

Autor Erik Larsson

2 feb 2011

Preț: 913^.01 lei 1113^.43 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 31

Autor Leendert M. Huisman

8 dec 2010

Preț: 614^.60 lei 723^.05 lei

6-8 săpt.

-15%

Digital Timing Measurements: From Scopes and Probes to Timing and Jitter

Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

11 aug 2006

Preț: 914^.06 lei 1114^.71 lei

6-8 săpt.

-18%

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing, nr. 34

Autor Manoj Sachdev et al.

10 noi 2010

Preț: 1172^.00 lei 1429^.28 lei

6-8 săpt.

-18%

Oscillation-Based Test in Mixed-Signal Circuits

Frontiers in Electronic Testing, nr. 36

Autor Gloria Huertas Sánchez et al.

23 noi 2010

Preț: 915^.73 lei 1116^.74 lei

6-8 săpt.

-18%

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

Frontiers in Electronic Testing, nr. 37

Editat de Mohammad Tehranipoor

23 noi 2010

Preț: 913^.62 lei 1114^.17 lei

6-8 săpt.

-18%

Timing Performance of Nanometer Digital Circuits Under Process Variations

Frontiers in Electronic Testing, nr. 39

Autor Victor Champac et al.

12 ian 2019

Preț: 694^.33 lei 846^.74 lei

6-8 săpt.

-18%

Soft Errors in Modern Electronic Systems

Frontiers in Electronic Testing, nr. 41

Editat de Michael Nicolaidis

30 sep 2010

Preț: 915^.43 lei 1116^.37 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 42

Autor Michael Gössel et al.

28 oct 2010

Preț: 610^.82 lei 718^.61 lei

6-8 săpt.

-15%

CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies

Autor Andrei Pavlov et al.

21 iun 2008

Preț: 961^.09 lei 1172^.06 lei

6-8 săpt.

-18%

Fault Diagnosis of Analog Integrated Circuits

Autor Prithviraj Kabisatpathy et al.

7 noi 2005

Preț: 617^.72 lei 726^.72 lei

6-8 săpt.

-15%

Fault-Tolerance Techniques for Sram-Based FPGAs

Autor Fernanda Lima Kastensmidt et al.

14 iun 2006

Preț: 617^.53 lei 726^.51 lei

6-8 săpt.

-15%

Editat de Hans-Joachim Wunderlich

7 dec 2009

Preț: 625^.03 lei 781^.28 lei

6-8 săpt.

-20%

Frontiers in Electronic Testing

Testability Concepts for Digital ICs: The Macro Test Approach

Efficient Branch and Bound Search with Application to Computer-Aided Design

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

Multi-Chip Module Test Strategies

Introduction to IDDQ Testing

Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques

On-Line Testing for VLSI

Formal Equivalence Checking and Design Debugging

Research Perspectives and Case Studies in System Test and Diagnosis

Delay Fault Testing for VLSI Circuits

Design for AT-Speed Test, Diagnosis and Measurement

Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Boundary-Scan Interconnect Diagnosis

A Designer’s Guide to Built-In Self-Test

Test Resource Partitioning for System-on-a-Chip

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Elements of STIL: Principles and Applications of IEEE Std. 1450

Verification by Error Modeling: Using Testing Techniques in Hardware Verification

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Advances in Electronic Testing: Challenges and Methodologies

Embedded Processor-Based Self-Test

Introduction to Advanced System-on-Chip Test Design and Optimization

Data Mining and Diagnosing IC Fails

Digital Timing Measurements: From Scopes and Probes to Timing and Jitter

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Oscillation-Based Test in Mixed-Signal Circuits

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

Timing Performance of Nanometer Digital Circuits Under Process Variations

Soft Errors in Modern Electronic Systems

New Methods of Concurrent Checking

CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies

Fault Diagnosis of Analog Integrated Circuits

Fault-Tolerance Techniques for Sram-Based FPGAs

Models in Hardware Testing

Papetărie, jocuri, reviste

Frontiers in Electronic Testing