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Transmission Electron Microscopy de C. Barry Carter

Transmission Electron Microscopy

Editat de C. Barry Carter, David B. Williams
en Limba Engleză Hardback – 22 iun 2026

ABORDAREA PRACTICĂ: Găsim în acest volum un echilibru tehnic riguros între fundamentul teoretic al microscopiei electronice de transmisie (TEM) și aplicabilitatea sa imediată în laborator. Spre deosebire de textele pur teoretice, Transmission Electron Microscopy pune accent pe instrucțiunile „hands-on”, oferind cititorului un ghid metodologic pentru caracterizarea materialelor. Recomandăm această a doua ediție pentru modul în care integrează peste 1200 de întrebări și exerciții, transformând o disciplină complexă într-un proces de învățare structurat.

Complementar lui Transmission Electron Microscopy and Diffractometry of Materials de Brent Fultz, care explorează în detaliu interacțiunea undelor cu materia și difracția de raze X, volumul de față se concentrează mult mai aplicat pe arhitectura instrumentului și pe tehnici specifice de operare, precum Kikuchi diffraction sau CBED. Structura cărții este segmentată logic pentru a facilita progresia: de la componentele fizice (lentile, pompe, surse de electroni) și pregătirea riguroasă a specimenelor, până la tehnici avansate de imagistică și analiză cantitativă prin spectrometrie de raze X.

În contextul operei autorilor, lucrarea reprezintă vârful de lance al expertizei lor în știința materialelor. C. Barry Carter face trecerea de la studiul structurilor cristaline și al defectelor, teme centrale în Ceramic Materials, la instrumentația de înaltă rezoluție necesară pentru a le observa. Dacă în volumele de conferință precum Applications of Microscopy in Materials and Life Sciences accentul cade pe noutățile din domeniu, acest manual rămâne resursa fundamentală pentru înțelegerea mecanismelor de contrast și a simulării de imagine, fiind esențial pentru orice cercetător care operează un microscop electronic.

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Specificații

ISBN-13: 9783031807886
ISBN-10: 303180788X
Pagini: 809
Dimensiuni: 210 x 279 mm
Ediția:Second Edition 2026
Editura: Springer International Publishing AG

De ce să citești această carte

Recomandăm această carte cercetătorilor și studenților la master sau doctorat care au nevoie de o bază solidă, dar practică, în utilizarea TEM. Câștigați acces la o metodologie clară de pregătire a probelor și interpretare a diagramelor de difracție. Este un instrument de lucru indispensabil în laborator, oferind soluții concrete pentru problemele de imagistică și analiză chimică prin spectrometrie, susținute de un suport vizual de excepție.

Despre autor

C. Barry Carter și David B. Williams sunt figuri proeminente în comunitatea științifică internațională. Carter este profesor distins, cunoscut pentru contribuțiile sale majore în domeniul materialelor ceramice și al microscopiei, fiind implicat activ în organizarea conferințelor de profil din Asia-Pacific. David B. Williams aduce o vastă experiență academică și practică în caracterizarea materialelor. Împreună, au creat un text care a devenit standardul global în domeniu, îmbinând rigoarea analitică cu o pedagogie adaptată nevoilor actuale din cercetare.

Descriere scurtă

This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition.
Praise for the first edition:
`The best textbook for this audience available.' – American Scientist
`Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope
`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron
`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998
`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley

Cuprins

Basics.- The Transmission Electron Microscope.- Scattering and Diffraction.- Elastic Scattering.- Inelastic Scattering and Beam Damage.- Electron Sources.- Lenses, Apertures, and Resolution.- How to ‘See’ Electrons.- Pumps and Holders.- The Instrument.- Specimen Preparation.- Diffraction.- Diffraction in TEM.- Thinking in Reciprocal Space.- Diffracted Beams.- Bloch Waves.- Dispersion Surfaces.- Diffraction from Crystals.- Diffraction from Small Volumes.- Obtaining and Indexing Parallel-Beam Diffraction Patterns.- Kikuchi Diffraction.- Obtaining CBED Patterns.- Using Convergent-Beam Techniques.- Imaging.- Amplitude Contrast.- Phase-Contrast Images.- Thickness and Bending Effects.- Planar Defects.- Imaging Strain Fields.- Weak-Beam Dark-Field Microscopy.- High-Resolution TEM.- Other Imaging Techniques.- Image Simulation.- Processing and Quantifying Images.- Spectrometry.- X-ray Spectrometry.- X-ray Spectra and Images.- Qualitative X-ray Analysis and Imaging.- Quantitative X-ray Analysis.- Spatial Resolution and Minimum Detection.- Electron Energy-Loss Spectrometers and Filters.- Low-Loss and No-Loss Spectra and Images.- High Energy-Loss Spectra and Images.- Fine Structure and Finer Details.

Recenzii

From the reviews of the second edition:
“This book is intended to be used as a textbook for material science students studying the theory, operation, and application of the TEM. It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science. It is richly illustrated with full-color figures and illustrations throughout the text. … There are an abundant number of references at the end of each chapter for further study … . This is an outstanding book … .” (IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010)
“D.B. Williams and C.B. Carter have now prepared a new edition, splendidly produced by Springer with colour throughout. … This textbook is magnificent, written in a very readable style, immensely knowledgeable, drawing attention to difficulties and occasionally to unsolved problems. Any microscopist who has mastered … the book relevant to his projects will be well armed for battle. … Buy this book!” (P. W. Hawkes, Ultramicroscopy, Vol. 110, 2010)

Notă biografică

C. Barry Carter is the Editor-in-Chief of the Journal of Materials Science and a CINT Distinguished Affiliate Scientist. He teaches at UConn.

David B. Williams is the Monte Ahuja Endowed Dean’s Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.


Textul de pe ultima copertă

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science.Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques. Praise for Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter:
“The best textbook for this audience available.” — American Scientist
“...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!” — Microscopy and Microanalysis
“This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.” — Micron
“The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.” — MRS Bulletin
“It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science….an outstanding book.” — IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010

Caracteristici

An essential companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter Equips the reader with a clear and deep understanding of TEM, the essential tool for studying nanomaterials Presents advanced topics with the same look, feel, and approach that students already know from Williams & Carter Features chapters on diffraction, high-resolution imaging, and chemical mapping by the leading experts in the field Provides the fundamentals for students to understand and interpret the results of electron tomography and electron holography, even if they will not employ these techniques themselves Includes supplementary material: sn.pub/extras