High-Resolution Electron Microscopy

De (autor)
Notă GoodReads:
en Limba Engleză Paperback – 13 Apr 2017
This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and
multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been
updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on
electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, and detectors (CCD cameras, Image plates and
direct-injection solid state detectors). The theory of Scanning transmission electron microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic
imaging, and cathodoluminescence. Sources of software for image interpretation and electron-optical design are given.
Citește tot Restrânge
Toate formatele și edițiile
Toate formatele și edițiile Preț Express
Paperback (2) 27180 lei  Economic 17-21 zile
  Oxford University Press – 13 Apr 2017 27180 lei  Economic 17-21 zile
  Oxford University Press – 09 Oct 2008 30960 lei  Economic 17-21 zile
Hardback (1) 58468 lei  Economic 17-21 zile
  Oxford University Press – 12 Sep 2013 58468 lei  Economic 17-21 zile

Preț: 27180 lei

Preț vechi: 29244 lei

Puncte Express: 408

Preț estimativ în valută:
5231 6157$ 4456£

Carte disponibilă

Livrare economică 05-09 octombrie

Preluare comenzi: 021 569.72.76


ISBN-13: 9780198795834
ISBN-10: 0198795831
Pagini: 432
Ilustrații: 163 b/w illustrations, 4 colour plates
Dimensiuni: 172 x 245 x 23 mm
Greutate: 0.81 kg
Ediția: 4
Editura: Oxford University Press
Colecția OUP Oxford
Locul publicării: Oxford, United Kingdom


... essential reading for anyone interested in HREM and its applications in materials characterization. The fourth edition provides much needed updates on aberration correction and the latest developments in electron detection technology and analytical microscopic techniques.

Notă biografică

John C. H. Spence is Regents' Professor of Physics at Arizona State University with a joint appointment at Lawrence Berkeley Laboratory. He completed a PhD in Physics at Melbourne University in Australia, followed by postdoctoral work in Materials Science at Oxford University, UK. He is a Fellow of the American Physical Society, of the Institute of Physics, of the American Association for the Advancement of Science, and of Churchill College Cambridge, UK. He is arecent co-editor of Acta Crystallographica and served on the editorial board of Reports on Progress in Physics. He has served on the Scientific Advisory Committee of the Molecular Foundry and the Advanced Light Source at the Lawrence Berkeley Laboratory and the DOE's BESAC committee. He has been awardedthe Burton Medal and the Distinguished Scientist Award of the Microscopy Society of America, and the Buerger Medal of the American Crystallographic Association.