Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 234
Peter W. Hawkes, Martin Hÿtchen Limba Engleză Hardback – 28 mai 2025
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
- Merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy
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Specificații
ISBN-13: 9780443428296
ISBN-10: 0443428298
Pagini: 296
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.57 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0443428298
Pagini: 296
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.57 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
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Cuprins
1. Unified formalism of light beam optics and light polarization
2. Relativistic Theory and Calculation of Electrostatic Focusing Systems
3. A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology
4. Artificial Intelligence and Deep Learning in Electron Microscopy
2. Relativistic Theory and Calculation of Electrostatic Focusing Systems
3. A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology
4. Artificial Intelligence and Deep Learning in Electron Microscopy