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Advances in Imaging and Electron Physics de Martin Hÿtch

Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 223

Editat de Martin Hÿtch, Peter W. Hawkes
en Limba Engleză Hardback – 25 aug 2022
Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.

  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
  • Updated release includes the latest information on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods
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Specificații

ISBN-13: 9780323988636
ISBN-10: 0323988636
Pagini: 266
Dimensiuni: 152 x 229 mm
Greutate: 0.53 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Public țintă

Academic, government and industrial sectors

Cuprins

Preface
Martin Hÿtch and Peter W. Hawkes
1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
2. Development of a global homography-based approach for high-angular resolution in the SEM
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
3. Implementing the homography-based global approach
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
4. Numerical validation and influence of optical distorsions on accuracy
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
5. Applications of the method
Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger,Vincent Taupin and Emmanuel Bouzy
6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devices
Clifford M. Krowne