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Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 218

Martin Hÿtch, Peter W. Hawkes
en Limba Engleză Hardback – 15 iun 2021
Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more.

  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
  • Updated release includes the latest information on the Coulomb Interactions in Charged Particle Beams
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Specificații

ISBN-13: 9780323915052
ISBN-10: 0323915051
Pagini: 276
Dimensiuni: 152 x 229 mm
Greutate: 0.54 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics


Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Cuprins

Preface
Martin Hÿtch and Peter W. Hawkes
1. Phase retrieval methods applied to coherent imaging
Tatiana Latychevskaia
2. X-ray phase-contrast imaging: a broad overview of some fundamentals
David M. Paganin and Daniele Pelliccia
3. Graphyne and borophene as nanoscopic materials for electronics - with review of the physics
C. M. Krowne
4. The ESAB effect and the physical meaning of the vector potential
R. Carles, O. Pujol, and J.-Ph. Perez
5. Electron image plane off-axis holography of atomic structures
Hannes Lichte