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Advances in Imaging and Electron Physics de Martin Hÿtch

Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 213

Martin Hÿtch, Peter W. Hawkes
en Limba Engleză Hardback – 19 mar 2020
Advances in Imaging and Electron Physics, Volume 213, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.


  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
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Specificații

ISBN-13: 9780128209974
ISBN-10: 0128209976
Pagini: 344
Dimensiuni: 152 x 229 mm
Greutate: 0.63 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Cuprins

Part 1: Quantum degeneracy
1. Partially coherent quantum degenerate electron matter waves
Sam Keramati, Eric Jones, Jeremy Armstrong, Herman Batelaan
Part 2: The contribution of atom probe tomography to the correlation of the optical and structural properties of semiconductor nanostructures
2. Laser-assisted atom probe tomography
Lorenzo Rigutti
3. Inaccuracies in atom probe measurements of semiconductor composition
Lorenzo Rigutti
4. Atom probe-based correlative microscopy
Lorenzo Rigutti
5. In-situ optical spectroscopy within an atom probe
Lorenzo Rigutti
Part 3: CPO Proceedings Papers
6. Derivation, Cross-Validation, and Comparison of Analytic Formulas for Electrostatic Deflector Aberrations
Eremey Valetov, Martin Berz
7. Analysis and Fringe Field Scaling of a Legacy Set of Electrostatic Deflector Aberration Formulas
Eremey Valetov
Part 4: Advances in Optical Electron Microscopy
8. Scanning Optical Microscopy
C. J. R. Sheppard