Frontiers in Electronic Testing

Filtre: Paperback

Frontiers in Electronic Testing

Soft Errors in Modern Electronic Systems

Frontiers in Electronic Testing, nr. 41

Editat de Michael Nicolaidis

5 noi 2012

Preț: 834^.71 lei 917^.26 lei

Indisponibil temporar

-9%

Frontiers in Electronic Testing, nr. 28

Autor Dimitris Gizopoulos et al.

14 dec 2011

Preț: 945^.81 lei 1182^.26 lei

6-8 săpt.

-20%

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Frontiers in Electronic Testing, nr. 21

Autor Krishnendu Chakrabarty

12 dec 2011

Preț: 632^.97 lei 744^.67 lei

6-8 săpt.

-15%

Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

29 noi 2010

Preț: 614^.98 lei 723^.51 lei

6-8 săpt.

-15%

Introduction to Advanced System-on-Chip Test Design and Optimization

Frontiers in Electronic Testing, nr. 29

Autor Erik Larsson

2 feb 2011

Preț: 923^.86 lei 1126^.66 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 37

Editat de Mohammad Tehranipoor

23 noi 2010

Preț: 924^.44 lei 1127^.37 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 8

Autor S. Chakravarty et al.

12 oct 2012

Preț: 637^.21 lei 749^.65 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 25

Autor Katarzyna Radecka et al.

7 dec 2010

Preț: 631^.39 lei 742^.81 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 11

Editat de Michael Nicolaidis et al.

6 dec 2010

Preț: 629^.86 lei 741^.01 lei

6-8 săpt.

-15%

Fault Diagnosis of Analog Integrated Circuits

Frontiers in Electronic Testing, nr. 30

Autor Prithviraj Kabisatpathy et al.

5 ian 2011

Preț: 616^.67 lei 725^.50 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

25 noi 2010

Preț: 914^.98 lei 1115^.84 lei

6-8 săpt.

-18%

Power-Constrained Testing of VLSI Circuits

Frontiers in Electronic Testing, nr. 22B

Autor Bashir M. Al-Hashimi et al.

9 dec 2010

Preț: 638^.15 lei 750^.76 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 26

Autor Said Hamdioui

9 dec 2010

Preț: 631^.79 lei 743^.28 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 35

Autor Francisco Da Silva et al.

20 oct 2014

Preț: 678^.60 lei 798^.36 lei

6-8 săpt.

-15%

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Frontiers in Electronic Testing, nr. 34

Autor Manoj Sachdev et al.

10 noi 2010

Preț: 1224^.46 lei 1493^.25 lei

6-8 săpt.

-18%

From Contamination to Defects, Faults and Yield Loss

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

26 sep 2011

Preț: 628^.04 lei 738^.87 lei

6-8 săpt.

-15%

Test Resource Partitioning for System-on-a-Chip

Frontiers in Electronic Testing, nr. 20

Autor Vikram Iyengar et al.

7 noi 2012

Preț: 616^.36 lei 725^.13 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing

Soft Errors in Modern Electronic Systems

Embedded Processor-Based Self-Test

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Fault-Tolerance Techniques for SRAM-Based FPGAs

Introduction to Advanced System-on-Chip Test Design and Optimization

Emerging Nanotechnologies

Introduction to IDDQ Testing

Verification by Error Modeling

On-Line Testing for VLSI

Fault Diagnosis of Analog Integrated Circuits

Digital Timing Measurements

Power-Constrained Testing of VLSI Circuits

Testing Static Random Access Memories

The Core Test Wrapper Handbook

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

From Contamination to Defects, Faults and Yield Loss

Test Resource Partitioning for System-on-a-Chip

Ficțiune

Business

Medicină

Lifestyle

Copii și adolescenți

Biografii

Artă, arhitectură şi design

Calculatoare și IT

Științe

Tehnologie și inginerie

Papetărie, jocuri, reviste