Filtre: Engleză Springer Us

Frontiers in Electronic Testing

Frontiers in Electronic Testing, nr. 3

Autor F. P. M. Beenker et al.

30 noi 1995

Preț: 976^.26 lei 1190^.55 lei

6-8 săpt.

-18%

Efficient Branch and Bound Search with Application to Computer-Aided Design

Frontiers in Electronic Testing, nr. 4

Autor Michael L. Bushnell et al.

31 dec 1995

Preț: 659^.00 lei 775^.29 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 7

Editat de Yervant Zorian

4 oct 2012

Preț: 601^.34 lei 751^.68 lei

38-44 zile

-20%

Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques

Frontiers in Electronic Testing, nr. 9

Autor Wolfgang Kunz et al.

7 dec 2010

Preț: 946^.45 lei 1183^.06 lei

6-8 săpt.

-20%

Research Perspectives and Case Studies in System Test and Diagnosis

Frontiers in Electronic Testing, nr. 13

Editat de William R. Simpson et al.

30 sep 1998

Preț: 977^.52 lei 1192^.10 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 14

Autor Kwang-Ting (Tim) Cheng et al.

31 oct 1998

Preț: 975^.42 lei 1189^.54 lei

6-8 săpt.

-18%

Design for AT-Speed Test, Diagnosis and Measurement

Frontiers in Electronic Testing, nr. 15

Editat de Benoit Nadeau-Dostie

30 sep 1999

Preț: 982^.28 lei 1197^.90 lei

6-8 săpt.

-18%

Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Frontiers in Electronic Testing, nr. 16

Editat de Adam Osseiran

10 dec 2010

Preț: 902^.39 lei 1100^.48 lei

6-8 săpt.

-18%

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Frontiers in Electronic Testing, nr. 17

Autor Vishwani Agrawal et al.

7 apr 2013

Preț: 783^.34 lei 955^.29 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 18

Autor Peter Y. K. Cheung et al.

28 feb 2001

Preț: 974^.57 lei 1188^.50 lei

6-8 săpt.

-18%

A Designer's Guide to Built-In Self-Test

Frontiers in Electronic Testing, nr. 19

Autor Charles E. Stroud

31 mai 2002

Preț: 1263^.31 lei 1540^.62 lei

6-8 săpt.

-18%

Test Resource Partitioning for System-on-a-Chip

Frontiers in Electronic Testing, nr. 20

Autor Vikram Iyengar et al.

7 noi 2012

Preț: 616^.36 lei 725^.13 lei

6-8 săpt.

-15%

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Frontiers in Electronic Testing, nr. 22A

Autor R. Dean Adams

26 apr 2013

Preț: 906^.47 lei 1105^.45 lei

6-8 săpt.

-18%

Power-Constrained Testing of VLSI Circuits

Frontiers in Electronic Testing, nr. 22B

Autor Bashir M. Al-Hashimi et al.

28 feb 2003

Preț: 660^.53 lei 777^.09 lei

6-8 săpt.

-15%

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Frontiers in Electronic Testing, nr. 23

Editat de Paolo Prinetto et al.

31 oct 2003

Preț: 982^.48 lei 1198^.15 lei

6-8 săpt.

-18%

Advances in Electronic Testing: Challenges and Methodologies

Frontiers in Electronic Testing, nr. 27

Editat de Dimitris Gizopoulos

5 dec 2014

Preț: 914^.35 lei 1115^.06 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 28

Autor Dimitris Gizopoulos et al.

20 dec 2004

Preț: 1025^.84 lei 1282^.31 lei

6-8 săpt.

-20%

Fault Diagnosis of Analog Integrated Circuits

Frontiers in Electronic Testing, nr. 30

Autor Prithviraj Kabisatpathy et al.

5 ian 2011

Preț: 616^.67 lei 725^.50 lei

6-8 săpt.

-15%

Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

29 noi 2010

Preț: 614^.98 lei 723^.51 lei

6-8 săpt.

-15%

Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

25 noi 2010

Preț: 914^.98 lei 1115^.84 lei

6-8 săpt.

-18%

Frontiers in Electronic Testing, nr. 35

Autor Francisco Da Silva et al.

20 oct 2014

Preț: 701^.49 lei 825^.27 lei

6-8 săpt.

-15%

Soft Errors in Modern Electronic Systems

Frontiers in Electronic Testing, nr. 41

Editat de Michael Nicolaidis

5 noi 2012

Preț: 834^.71 lei 917^.26 lei

Indisponibil temporar

-9%

Frontiers in Electronic Testing

Testability Concepts for Digital ICs

Efficient Branch and Bound Search with Application to Computer-Aided Design

Multi-Chip Module Test Strategies

Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques

Research Perspectives and Case Studies in System Test and Diagnosis

Delay Fault Testing for VLSI Circuits

Design for AT-Speed Test, Diagnosis and Measurement

Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Boundary-Scan Interconnect Diagnosis

A Designer's Guide to Built-In Self-Test

Test Resource Partitioning for System-on-a-Chip

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Power-Constrained Testing of VLSI Circuits

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Advances in Electronic Testing: Challenges and Methodologies

Embedded Processor-Based Self-Test

Fault Diagnosis of Analog Integrated Circuits

Fault-Tolerance Techniques for SRAM-Based FPGAs

Digital Timing Measurements

The Core Test Wrapper Handbook

Soft Errors in Modern Electronic Systems

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