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Atomic Diffusion in Glasses Studied with Coherent X-Rays: Springer Theses

Autor Manuel Ross
en Limba Engleză Hardback – 29 ian 2016
This thesis provides the first successful study of jump diffusion processes in glasses on the atomic scale, utilizing a novel coherent technique. This new method, called atomic-scale X-ray Photon Correlation Spectroscopy or aXPCS, has only recently been proven to be able to capture diffusion processes with atomic resolution in crystal systems.

With this new toolkit for studying atomic diffusion in amorphous systems, new insight into basic processes in a wide range of technically relevant materials, like fast ionic conductors, can be obtained.
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Specificații

ISBN-13: 9783319286440
ISBN-10: 3319286447
Pagini: 132
Ilustrații: XVIII, 111 p. 67 illus., 22 illus. in color.
Dimensiuni: 160 x 241 x 13 mm
Greutate: 0.37 kg
Ediția:1st edition 2016
Editura: Springer
Colecția Springer Theses
Seria Springer Theses

Locul publicării:Cham, Switzerland

Public țintă

Research

Cuprins

Introduction.- Theory.- Experimental.- Data Analysis.- Proof of Concept: Direct Observation of Atomic Diffusion in Glasses.- Practical Application: Tailoring Fast Ionic Diffusion.- Conclusion.

Textul de pe ultima copertă

This thesis provides the first successful study of jump diffusion processes in glasses on the atomic scale, utilizing a novel coherent technique. This new method, called atomic-scale X-ray Photon Correlation Spectroscopy or aXPCS, has only recently been proven to be able to capture diffusion processes with atomic resolution in crystal systems.

With this new toolkit for studying atomic diffusion in amorphous systems, new insight into basic processes in a wide range of technically relevant materials, like fast ionic conductors, can be obtained.

Caracteristici

Nominated as an outstanding Ph.D. thesis by the University of Vienna, Austria Advances the technical forefront of X-ray scattering methods by showing how atomic diffusion can be measured in glasses Demonstrates with detailed figures the crucial aspects of building a stable sample environment for atomic-resolution measurements Includes supplementary material: sn.pub/extras