Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

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en Limba Engleză Hardback – 17 Oct 2014
This book serves as a practical reference for anyone involved in any form of Secondary Ion Mass Spectrometry (SIMS). This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications.
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ISBN-13: 9781118480489
ISBN-10: 1118480481
Pagini: 384
Ilustrații: black & white illustrations, black & white tables, figures, graphs
Dimensiuni: 156 x 243 x 24 mm
Greutate: 0.66 kg
Editura: Wiley
Locul publicării: Hoboken, United States

Public țintă

students (Biology, Chemistry, Engineering, Geology, Physics, and the Materials Science) through to advanced researchers (academic or industrial), i.e. anyone requiring knowledge of either the fundamental or practical aspects of SIMS (Professors, lab managers, etc.)