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Variation Tolerant On-Chip Interconnects de Ethiopia Enideg Nigussie

Variation Tolerant On-Chip Interconnects

Autor Ethiopia Enideg Nigussie
en Limba Engleză Hardback – dec 2011
This book presents design techniques, analysis and implementation of high performance and power efficient, variation tolerant on-chip interconnects. Given the design paradigm shift to multi-core, interconnect-centric designs and the increase in sources of variability and their impact in sub-100nm technologies, this book will be an invaluable reference for anyone concerned with the design of next generation, high-performance electronics systems.
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Specificații

ISBN-13: 9781461401308
ISBN-10: 1461401305
Pagini: 184
Ilustrații: XII, 172 p.
Dimensiuni: 160 x 241 x 15 mm
Greutate: 0.45 kg
Ediția:2012
Editura: Springer
Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

Introduction.- On-Chip Communication.- Interconnect Design Techniques.- Design of Delay-Insensitive Current Sensing Interconnects.- Enhancing Completion Detection Performance.- Energy Efficient Semi-Serial Interconnect.- Comparison of the Designed Interconnects.- Circuit Techniques for PVT Variation Tolerance.

Textul de pe ultima copertă

This book presents design techniques, analysis and implementation of high performance and power efficient, variation tolerant on-chip interconnects.  Given the design paradigm shift to multi-core, interconnect-centric designs and the increase in sources of variability and their impact in sub-100nm technologies, this book will be an invaluable reference for anyone concerned with the design of next generation, high-performance electronics systems.
  • Provides comprehensive, circuit-level explanation of high-performance, energy-efficient, variation-tolerant on-chip interconnect;
  • Describes design techniques to mitigate problems caused by variation;
  • Includes techniques for design and implementation of self-timed on-chip interconnect, delay variation insensitive communication protocols, high speed signaling techniques and circuits, bit-width independent completion detection and process, voltage and temperature variation tolerance.