Hardware and Software: Verification and Testing: 6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers: Lecture Notes in Computer Science, cartea 6504
Editat de Sharon Barner, Ian Harris, Daniel Kroening, Orna Razen Limba Engleză Paperback – 17 mar 2011
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Specificații
ISBN-13: 9783642195822
ISBN-10: 3642195822
Pagini: 210
Ilustrații: X, 197 p. 51 illus., 13 illus. in color.
Dimensiuni: 155 x 235 x 15 mm
Greutate: 0.3 kg
Ediția:2011
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seriile Lecture Notes in Computer Science, Programming and Software Engineering
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642195822
Pagini: 210
Ilustrații: X, 197 p. 51 illus., 13 illus. in color.
Dimensiuni: 155 x 235 x 15 mm
Greutate: 0.3 kg
Ediția:2011
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seriile Lecture Notes in Computer Science, Programming and Software Engineering
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchTextul de pe ultima copertă
This book constitutes the thoroughly refereed post-conference proceedings of the 6th International Haifa Verification Conference, HVC 2010, held in Haifa, Israel in October 2010.
The 10 revised full papers presented together with 7 invited papers were carefully reviewed and selected from 30 submissions. The papers address all current issues, challenges and future directions of verification for hardware, software, and hybrid systems and have a research focus on hybrid methods and the migration of methods and ideas between hardware and software, static and dynamic analysis, pre- and post-silicon.
The 10 revised full papers presented together with 7 invited papers were carefully reviewed and selected from 30 submissions. The papers address all current issues, challenges and future directions of verification for hardware, software, and hybrid systems and have a research focus on hybrid methods and the migration of methods and ideas between hardware and software, static and dynamic analysis, pre- and post-silicon.
Caracteristici
Unique visibility fast-track-conference proceedings state-of-the-art research