Filtre: Hardback Springer US, New York, N.Y.

Frontiers in Electronic Testing

Fault Diagnosis of Analog Integrated Circuits

Frontiers in Electronic Testing, nr. 30

Autor Prithviraj Kabisatpathy et al.

5 ian 2011

Preț: 610^.96 lei 718^.77 lei

6-8 săpt.

-15%

Fault-Tolerance Techniques for SRAM-Based FPGAs

Frontiers in Electronic Testing, nr. 32

Autor Fernanda Lima Kastensmidt et al.

29 noi 2010

Preț: 611^.12 lei 718^.97 lei

6-8 săpt.

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Digital Timing Measurements: From Scopes and Probes to Timing and Jitter

Frontiers in Electronic Testing, nr. 33

Autor Wolfgang Maichen

25 noi 2010

Preț: 906^.03 lei 1104^.92 lei

6-8 săpt.

-18%