Failure Mechanisms in Semiconductor Devices 2e

en Limba Engleză Hardback – 19 iun 1997

In dieser zweiten, aktualisierten Auflage identifizieren die Autoren die Ursachen und Mechanismen, die zu Ausfällen von Halbleiterbauelementen führen. Durch Erkennungsmethoden und Technologien zur Vermeidung von Defekten, die in diesem Buch ausführlich beschrieben werden, wird die Zuverlässigkeit der Bauelemente in der Praxis entscheidend bestimmt.

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Specificații

ISBN-13: 9780471954828
ISBN-10: 0471954829
Pagini: 358
Dimensiuni: 166 x 235 x 27 mm
Greutate: 0.62 kg
Ediția:2nd Edition
Editura: Wiley
Locul publicării:Chichester, United Kingdom

Cuprins

Notă biografică

E. Ajith Amerasekera is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley. Farid N. Najm is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley.

Descriere

In this second edition, the authors identify the sources of failure mechanism in semiconductor devices, examine possible detection and elimination techniques, and determine the effectiveness of reliability devices. The references have been updated and recent advances are discussed.

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