Energy-Efficient Fault-Tolerant Systems
Editat de Jimson Mathew, Rishad A. Shafik, Dhiraj K. Pradhanen Limba Engleză Paperback – 23 aug 2016
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Specificații
ISBN-13: 9781493945511
ISBN-10: 1493945513
Pagini: 352
Ilustrații: XIV, 335 p. 132 illus., 51 illus. in color.
Dimensiuni: 155 x 235 x 20 mm
Greutate: 0.53 kg
Ediția:Softcover reprint of the original 1st edition 2014
Editura: Springer
Locul publicării:New York, NY, United States
ISBN-10: 1493945513
Pagini: 352
Ilustrații: XIV, 335 p. 132 illus., 51 illus. in color.
Dimensiuni: 155 x 235 x 20 mm
Greutate: 0.53 kg
Ediția:Softcover reprint of the original 1st edition 2014
Editura: Springer
Locul publicării:New York, NY, United States
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Cuprins
Evolution of Fault Tolerant Design.- Fault and Reliability Models.- Energy Efficient Design Techniques.- Error Correction Coding.- System-level Reliable Design.- Fault Tolerant.- Finite Field Arithmetic Circuit Design and Testing Techniques.- Reliable Network-on-Chip Architectures.- Energy Efficient Reconfigurable Systems.- Bio-Inspired Online Fault Detection in NoC Interconnect.- Fault-tolerant dynamically reconfigurable NoC-based SoC.
Textul de pe ultima copertă
This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.
· Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability;
· Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches;
· Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.
· Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability;
· Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches;
· Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.