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Characterization of Advanced Materials de W. Altergott

Characterization of Advanced Materials

Editat de W. Altergott, E. Henneke
en Limba Engleză Paperback – 26 oct 2012
From a July 1987 symposium in Monterey, California, 11 invited papers discuss the latest techniques for characterizing composites and ceramics, and report evaluation findings on electronic materials, ceramics, composites, surface treatments, and new alloys. Annotation copyright Book News, Inc. Portl
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Specificații

ISBN-13: 9781461366393
ISBN-10: 1461366399
Pagini: 196
Ilustrații: IX, 183 p.
Dimensiuni: 178 x 254 x 11 mm
Greutate: 0.38 kg
Ediția:1990
Editura: Springer
Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

Stereo X-Ray Radiography of Composite Materials.- Application of X-Ray Computed Tomography to Ceramic/Ceramic Composites.- High Speed Heterodyne Holographic Interferometry.- Optical Fiber Waveguide Methods for Advanced Materials.- Adiabatic Thermography of Composite Materials.- Application of Scanning Acoustic Microscopy to Advanced Structural Ceramics.- TEM Studies of Semiconductor Materials.- The Characterization of New Austenitic Stainless Steels Highly Resistant to Cavitation-Erosion.- Characterization of Duplex Stainless Steels by TEM, SANS, and APFIM Techniques.- Characterization of Microstructures in Rapidly Solidified Alloys.- Characterization of Wear-Resistant Coatings and Surface Treatments.