Cantitate/Preț
Produs

Nanometer-Scale Defect Detection Using Polarized Light

Autor Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
en Limba Engleză Hardback – 22 aug 2016
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
Citește tot Restrânge

Preț: 95094 lei

Preț vechi: 104499 lei
-9%

Puncte Express: 1426

Preț estimativ în valută:
16803 19368$ 14670£

Carte tipărită la comandă

Livrare economică 16-30 mai


Specificații

ISBN-13: 9781848219366
ISBN-10: 1848219369
Pagini: 320
Dimensiuni: 161 x 240 x 22 mm
Greutate: 0.64 kg
Ediția:1
Editura: Wiley
Locul publicării:Hoboken, United States