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Characterization of Advanced Materials

Editat de W. Altergott, E. Henneke
en Limba Engleză Hardback – 30 sep 1991
From a July 1987 symposium in Monterey, California, 11 invited papers discuss the latest techniques for characterizing composites and ceramics, and report evaluation findings on electronic materials, ceramics, composites, surface treatments, and new alloys. Annotation copyright Book News, Inc. Portl
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Specificații

ISBN-13: 9780306438370
ISBN-10: 0306438372
Pagini: 196
Dimensiuni: 183 x 260 x 17 mm
Greutate: 0.58 kg
Ediția:New.
Editura: Springer
Locul publicării:Boston, MA, United States

Public țintă

Research

Cuprins

Stereo X-Ray Radiography of Composite Materials.- Application of X-Ray Computed Tomography to Ceramic/Ceramic Composites.- High Speed Heterodyne Holographic Interferometry.- Optical Fiber Waveguide Methods for Advanced Materials.- Adiabatic Thermography of Composite Materials.- Application of Scanning Acoustic Microscopy to Advanced Structural Ceramics.- TEM Studies of Semiconductor Materials.- The Characterization of New Austenitic Stainless Steels Highly Resistant to Cavitation-Erosion.- Characterization of Duplex Stainless Steels by TEM, SANS, and APFIM Techniques.- Characterization of Microstructures in Rapidly Solidified Alloys.- Characterization of Wear-Resistant Coatings and Surface Treatments.