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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis de P. W. Hawkes

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: Springer Series in Optical Sciences, cartea 45

P. W. Hawkes Autor Ludwig Reimer
en Limba Engleză Hardback – 17 sep 1998
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Specificații

ISBN-13: 9783540639763
ISBN-10: 3540639764
Pagini: 544
Ilustrații: XIV, 529 p.
Dimensiuni: 155 x 235 x 30 mm
Greutate: 0.89 kg
Ediția:2nd completely rev. and updated ed. 1998
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Optical Sciences

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

Electron Optics of a Scanning Electron Microscope.- Electron Scattering and Diffusion.- Emission of Backscattered and Secondary Electrons.- Electron Detectors and Spectrometers.- Image Contrast and Signal Processing.- Electron-Beam-Induced Current and Cathodoluminescence.- Special Techniques in SEM.- Crystal Structure Analysis by Diffraction.- Elemental Analysis and Imaging with X-Rays.

Recenzii

"...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM."
T Mulvey, Measurement Science and Technology. 11, No12, December 2000

Textul de pe ultima copertă

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Caracteristici

Main benefit is information about the physics of image formation and microanalysis in scanning electron microscopy 2nd, completely revised and updated edition